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News
:: SST Review ::
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Michael Gostein, Peter A. Rosenthal, Alex Maznev, Philips AMS; Alexander Kasic, Peter Weidner, Infineon Technologies; Pierre-Yves Guittet, ...
Network Profiles
LinkedIn: Pierre-Yves Guittet 戴宏恩 | LinkedIn
立即查看Pierre-Yves Guittet 戴宏恩（台灣）的專業檔案。LinkedIn 協助像Pierre-Yves Guittet 戴宏恩這樣的專業人士順利找到理想人選、產業專家和業務夥伴。
LinkedIn: Pierre-Yves Guittet 戴宏恩 | LinkedIn
LinkedIn is het grootste zakelijke netwerk ter wereld en stelt professionals als Pierre-Yves Guittet 戴宏恩 in staat connecties van aanbevolen kandidaten, ...
Interests
Pierre-Yves Guittet - Patents
www.freshpatents.com
Pierre-Yves Guittet patents. Recent bibliographic sampling of Pierre-Yves Guittet patents listed/published in the public domain by the USPTO (USPTO Patent ...
Pierre-Yves Guittet, Inventor, Dresden, DE
www.patentbuddy.com
Pierre-Yves Guittet's Inventor profile, München, DE, Nanda Technologies GmbH;, 10 patents/applications from Jun 25, to Apr 26, 2012, 17 forward...
Books & Literature
Infrarot-Spektral-Ellipsometrie (IRSE): Prinzip, Entwicklung von
books.google.de
Infrarot-Spektral-Ellipsometrie (IRSE): Prinzip, Entwicklung von Tollapplikationen. Front Cover. Silke Sommerkorn, Gerd Dost, Pierre-Yves Guittet
Related Documents
Guittet, Pierre-Yves [WorldCat Identities]
www.worldcat.org
Most widely held works by Pierre-Yves Guittet. Infrarot-Spektral-Ellipsometrie (IRSE) : Prinzip, Entwicklung von Tollapplikationen by Silke Sommerkorn( Book )
Publications
Pierre-Yves Guittet
spie.org
SPIE Profile of Pierre-Yves Guittet, Nanda-Technologies GmbH. SPIE Profiles is a networking platform for optics and photonics professionals.
Miscellaneous
US B2 - Method and apparatus for measuring a surface profile of...
patents.google.com
In order to measure a surface profile of a sample, an imprint of the surface profile to be examined is produced in a transfer material. The sample...
US A1 - Method and apparatus for identifying a ...
patents.google.com
US A1 * Pierre-Yves Guittet Noninvasive method for characterizing and identifying embedded micropatterns.
US B2 - Apparatus and method for monitoring trench profiles and...
patents.google.com
An apparatus for monitoring a trench profile of a substrate includes a radiation-emitting unit for irradiating the substrate with infrared radiation. The...
2011 IEEE 61st Electronic Components and Technology ...docplayer.net › ...
docplayer.net
... and Bart Swinnen IMEC; Valery Pepper, Pierre-Yves Guittet, Greg Savage, and Lars Markwort Nanda Tech GmbH Vacuum Underfill Technology for Advanced ...
Ultra-fast in-line inspection for the 3D interconnect production line...
docplayer.net
... Sematech Wrkshp n 3D Intercnnect Metrlgy, July 14 th Ultra-fast in-line inspectin fr the 3D intercnnect prductin line Lars Markwrt, Pierre-Yves Guittet, Greg.
US B2 - Method and apparatus for identifying a product...
patents.google.com
US A1 (en) *, Pierre-Yves Guittet, Noninvasive method for characterizing and identifying embedded ...
US A1 - Noninvasive method for characterizing and...
patents.google.com
The invention relates to a method for noninvasively characterizing embedded micropatterns which are hidden under the surface of a wafer down to 100 μm....
US B2 - Methods of processing and inspecting semiconductor...
patents.google.com
A method of inspecting a semiconductor substrate having a back surface and including at least one piece of metal embedded in the substrate comprises...
orepic.com › choppedtsuey › followerschoppedtsuey follower users on Instagram - Orepic
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Nathália Inc. @nathalia_inc · Albert Yin @fuzzniner · Christina Wood @thegalleristdc · Platinum Skin Care @platinum_skin_care · Pierre-yves Guittet @pyguittet.
Infrared spectroscopic ellipsometry in semiconductor ...www.spiedigitallibrary.org › full
www.spiedigitallibrary.org
Pierre-Yves Guittet, Ulrich Mantz, Peter Weidner, Jean-Louis Stehle, Marc Bucchia, Sophie Bourtault, Dorian Zahorski. Author Affiliations +. Pierre-Yves Guittet,1 ...
Inventors list Gs-Gu - Patent application
www.patentsencyclopedia.com
Pierre-Yves Guittet, DE, Unterschleissheim, METHODS OF INSPECTING AND MANUFACTURING SEMICONDUCTOR WAFERS ...
M. RF Design 분과 - PDF Free Download - ZOMBIEDOC.COMzombiedoc.com › m-rf-design
zombiedoc.com
... Surface, Edge and Bonding Interface for 3D-stacking 저자: Pierre-Yves Guittet, Lars Markwort, Greg Savage, and Christoph Kappel 소속: Nanometrics Gmbh
Full wafer macro-CD imaging for excursion control of fast patterning...
www.spiedigitallibrary.org
SPIE Digital Library Proceedings
Measuring deep-trench structures with model-based IR - Document -...
go.gale.com
Gale Academic OneFile includes Measuring deep-trench structures with model-based IR by Michael Gostein, Peter A. Rosenthal, Al. Click to explore.
Wafer current measurement for process monitoring
www.spiedigitallibrary.org
Wafer current measurement for process monitoring. Dmitry Shur, Alexander Kadyshevitch, Jeremy Zelenko, Carlos Mata, Victor Verdugo, Pierre-Yves Guittet, ...
ONTO INNOVATION INC. - FORM 8-K - EX EQUITY PURCHASE AGREEMENT...
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ONTO INNOVATION INC. - FORM 8-K - EX EQUITY PURCHASE AGREEMENT - November 23, 2011
Full wafer macro-CD imaging for excursion control of fast patterning...
www.semanticscholar.org
CD-imaging is demonstrated for the monitoring of key patterning process steps in gate formation and use cases for stand-alone, integrated and smart sampling...
Pierre-Yves - Patent applications
www.patentsencyclopedia.com
Pierre-Yves Guittet, Munchen DE. Patent application number, Description ... Pierre-Yves Guittet, Unterschleissheim DE. Patent application number, Description ...
Pierre Guittet | www.picswe.com
www.picswe.com
jpg 300x425. Photos from pierre yves guittet on myspace jpg 300x425 Pierre guittet. Download Image. Photos from pierre yves guittet on myspace.
Pierre yves guittet
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