Adit D Singh, 61, Auburn University, US, Auburn University
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Job: Professor; City: Auburn; Company: Auburn University
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Adit Singh is a professor in the Engineering department at Auburn University - see what their students are saying about them or leave a rating yourself.
ETS Preliminary Program Registration/Information Hours
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Adit SINGH (Auburn University - United States). 14:00-15:00 6B: EMBEDDED TUTORIAL. Chair: Pascal Vivet (CEA-Leti, FR). • Practices in ...
Google Groups: Call for Papers for IEEE Int. Workshop on IDDQ Testing
: ... ICTAS, China Rob Roy, NEC, USA Adit Singh, Auburn University, USA Jerry Soden, Sandia National Labs, USA Carol Tong, Colorado State University, USA.
Google Groups: IDDQ'98 (in conj. with ICCAD'98)
: ... Hewlett Packard Andrew Richardson, Lancaster University Rob Roy, Intel Adit Singh, Auburn University Manoj Sachdev, University of Waterloo Jerry Soden, ...
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Adit Singh | LinkedIn
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View Adit Singh's professional profile on LinkedIn. LinkedIn is the world's largest business network, helping professionals like Adit Singh discover inside ...
Adit Singh - EasyChaireasychair.org › smart-program › ITC2019 › person97
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ITC 2019: INTERNATIONAL TEST CONFERENCE PROGRAMAUTHORSKEYWORDS. Adit Singh. Organization: Auburn University. Pages in this Program ...
Early program | IEEE VLSI Test Symposium
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Ujjwal GUIN, Zhou ZIQI, Adit SINGH (Auburn University), A Novel Design-for- Security (DFS) Architecture to Prevent Unauthorized IC Overproduction. Dongrong ZHANG, Xiaoxiao WANG (Beihang University), Miao HE, Mark TEHRANIPOOR (University of Florida), A Novel Dynamic Obfuscation Scan Design for Protecting IPs ...
Embedded Tutorials - European Test Symposium
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Presenter: Adit Singh (Auburn University) Session: 6A. Abstract: Cell Aware testing has received much publicity over the past couple of years, with several reported success stories in screening defects missed by traditional stuck-at and transition delay fault (TDF) testing. For example, at ITC 2012, Hapke et al. reported
IEEE DESIGN & TEST OF COMPUTERS || Editorial
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Adit Singh, Auburn University; .edu. DFM and Yield: Anne E. Gattiker, IBM;. .com. Design-for-Testability Rubin Parekhji, Teaxs Instruments (India); . Economics of Design and Test: Magdy Abadir, Freescale Semiconductor; . Embedded Real-Time ...
IEEE Workshop on Defect and Date Driven Testing (D3T)
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Adit Singh (Auburn University). Session 4: A Good Die, or an Outlier: New Ways to Tell. 8:00am – 10:30 am. 9:00 to 9:30: Mathematical Framework for Selecting Tests for Outlier Detection. H.C.M. Bossers, J.L. Hurink, G.J.M. Smit (University of Twente). 9:30 to 10:00: Improving Test Quality Using Data Mining – A Case Study .
NSF Award Search: Award# Wafer Oriented Trend Analysis for...
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divider line. Investigator(s):, Adit Singh .edu (Principal Investigator) Victor Nelson (Co-Principal Investigator). divider line. Sponsor: Auburn University 310 Samford Hall Auburn University, AL (334) divider line. NSF Program(s):, DES AUTO FOR MICRO & NANO SYS. divider line.
Adit Singhtss.date.upb.de › tss2010 › p_singh
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Adit Singh. Lecturer. Auburn University Dept. of Electrical & Computer Engineering 200 Broun Hall Auburn AL USA. Adit D. Singh received the B.Tech ...
NSF Award Search: Award# ITR: Built-In Test of ...www.nsf.gov › awardsearch › showAward
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Investigator(s):, Adit Singh .edu (Principal Investigator). divider line. Sponsor: Auburn University 310 Samford Hall Auburn University, AL ...
SHF: Small: Minimizing System Level Testing of Processor ...grantome.com › grant › NSF › CCF
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Auburn University, Auburn University, AL, United States. Search 12 grants from Adit Singh · Search grants from Auburn University. Share this grant: LinkedIn ...
NSF Award Search: Award# EHCS: Dynamic Vertically...
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Investigator(s):, Adit Singh .edu (Principal Investigator). divider line. Sponsor: Auburn University 310 Samford Hall
VLSI Test Symposium 2014
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Chao Han, Adit Singh (Auburn University). Session 1B: Analytical Methods in Analog Test (Joseph Phelps) Moderator: Senthil Arasu Thirunavukarasu ...
Tutorials | IEEE VLSI Test Symposium
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Tutorial #3: Understanding the Unique Fallout From Cell Aware Tests. Organizer & Instructor: Adit Singh (Auburn University) ...
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