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ESLAB | Publications

www.ida.liu.se

Jaynarayan T Tudu, Erik Larsson, Virendra Singh, Adit Singh IEEE/VSI VLSI Design and Test Symposium (VDAT), Bangalore, India, July 8-10, ...

VLSI Design and Test: 17th International Symposium, VDAT 2013,...

books.google.de

This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July The...

VLSI Design and Test: 21st International Symposium, VDAT 2017,...

books.google.de

This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July...

VLSI Design and Test: 17th International Symposium, VDAT ...books.google.ro › books

books.google.ro

... VDAT 2013, Jaipur, India, July , 2013, Proceedings Manoj Singh Gaur, Mark Zwolinski, Vijay Laxmi, D. Boolchandani, Virendra Sing, Adit Singh ...

Google Groups: VLSI DESIGN'95 Delhi Jan 4-7

: ... VLSI Arithmetic 2 (4 papers) Design and Synthesis for Testability (4 papers). For registration information, contact Adit Singh at: .edu.

Google Groups: WANTED: IEEE/CSI VLSI DESIGN95,INDIA: CFP/

: 71 Miller Road Rochester, NY Bangalore USA INDIA .edu For additional information, contact the Publicity Co-Chairs: Adit Singh ...

Google Groups: VLSI DESIGN'95 New Delhi Jan 4-7

: For any additional assistance, contact the Publicity Chair, Adit Singh at: (tel) +1 (205) , or (email) .edu.

Google Groups: 15th IEEE VLSI TEST SYMPOSIUM, 1997: Call for Papers

: For general information, contact: Submit paper proposals to: Yervant ZORIAN, General Chair Adit SINGH, Program Co-Chair Lucent Bell Laboratories Auburn ...

All web results to the name "Adit Singh"

Wafer Oriented Trend Analysis for VLSI Test Opitmazation - Adit Singh

grantome.com

The mainstream approach to improving the quality of IC testing is to develop better tests that target more realistic failure mechanisms. This project is...

Early program | IEEE VLSI Test Symposium

www.tttc-vts.org

Ujjwal GUIN, Zhou ZIQI, Adit SINGH (Auburn University), A Novel Design-for- Security (DFS) Architecture to Prevent Unauthorized IC Overproduction. Dongrong ZHANG, Xiaoxiao WANG (Beihang University), Miao HE, Mark TEHRANIPOOR (University of Florida), A Novel Dynamic Obfuscation Scan Design for Protecting IPs ...

VLSI Test Symposium 2014

www.tttc-vts.org

Chao Han, Adit Singh (Auburn University). Session 1B: Analytical Methods in Analog Test (Joseph Phelps) Moderator: Senthil Arasu Thirunavukarasu ...

Tutorials | IEEE VLSI Test Symposium

tttc-vts.org

Tutorial #3: Understanding the Unique Fallout From Cell Aware Tests. Organizer & Instructor: Adit Singh (Auburn University) ...

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Adit Singh and Vlsi Free People Check