Telephone & Addresses
Boon Chan, 84, Atlanta, Highland Vw Ne
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Boon Chan, 44, Cape Canaveral, Astronaut Blvd
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Boon Chan, Columbia, Cordage Walk
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Boon Chan, 92, Sugar Land, N Hall Dr
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Business Profiles
Education
classmates: Boon Chan
Ames High School, Ames, IA,
classmates: Wah Teik Chan
University of Massachusetts, Amherst, MA,
classmates: Beth Chan Boon
Buena High School, Sierra Vista, AZ,
C. Grant Willson - McKetta Department of Chemical Engineeringwww.che.utexas.edu › people › faculty › willson
www.che.utexas.edu
Rincon-Delgadillo, Boon Teik Chan, Geert Mannaert, Geert Vandenberghe, C. Grant Willson, Christopher J. Ellison, Diane Hymes “Evolution of roughness during the ...
Heritage
Warren-M-Williams - User Trees - Genealogy.com
www.genealogy.com
Family Tree Maker user home page for Warren-M-Williams.
Books & Literature
Boon Teik Chan | Author | Microsoft Academicacademic.microsoft.com › author › publication
academic.microsoft.com
Biography. Current projects: - a. iN3 GAA exploration, new devices concept (Forksheet, CFET, E2D2FET and 2D FET) b. Logic ILD0 / RMG modules c.
Training in Water Resources Management (In Malaysia) - Boon Teik Chan...
books.google.de
Training in Water Resources Management (In Malaysia). Front Cover. Boon Teik Chan. Ministry of Science, Technology and Environment, Water resource ...
Related Documents
Painel de recortes de Boon Teik Chan
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Publicly shared SlideShare clipboards created by Boon Teik Chan. O SlideShare utiliza cookies para otimizar a funcionalidade e o desempenho do site, assim como para apresentar publicidade mais relevante aos nossos usuários.
[PDF] DSAAS A COMPLEMENTARY TECHNIQUE FOR CONTACT HOLE ...euvlsymposium.lbl.gov › pdf › pres › GeertVandenberghe
euvlsymposium.lbl.gov
FOR CONTACT HOLE PATTERNING. ROEL GRONHEID, ARJUN SINGH, JOOST BEKAERT, TODD YOUNKIN*, SAFAK SAYAN*,. NADIA VANDENBROECK, BOON TEIK CHAN, GEERT VANDENBERGHE.
Defect reduction and defect stability in IMEC's 14nm half-pitch...
www.deepdyve.com
1. , Paulina Rincon Delgadillo. 1,2,3. , Hari Pathangi. 1. , Dieter Van den Heuvel. 1. ,. Doni Parnell. 4. , Boon Teik Chan. 1. , Yu-Tsung Lee. 1. , Lieve van Look. 1.
Scientific Publications
Microelectronic Engineering | Nano Lithography |...
www.sciencedirect.com
13 Dec · Boon Teik Chan, Shigeru Tahara, Doni Parnell, Paulina A. Rincon Delgadillo, ... Werner Boullart. 1 July 2014: Pages : Download PDF.
Device Scaling Latest Research Papers | ScienceGatewww.sciencegate.app › keywords
www.sciencegate.app
Boon Teik Chan ◽ ... Keyword(s):. Threshold Voltage ◽. Metal Gate ◽. Unit Process ◽. Interface Dipole ◽. Device Scaling ◽. Device Integration ◽.
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www.sciencedirect.com
Yu Qiu a,b,n, Oliver Kunz c, Antonin Fejfar d, Martin Ledinskэ d, Boon Teik Chan a,. Ivan Gordon a, Dries Van Gestel a, Srisaran Venkatachalm ...
Publications
SpringerCitations - Details Page
citations.springernature.com
Yu Qiu, Oliver Kunz, Antonin Fejfar, Martin Ledinský, Boon Teik Chan, Ivan Gordon, Dries Van Gestel, Srisaran Venkatachalm and Renate Egan. Journal: Solar ...
Download the MNE Scientific program - MNE | 2017mne2017.org/wp-content/uploads Booklet_MNE_FINAL_WEB.pdf
mne2017.org
for thermal scanning probe lithography (T-SPL) patterning. Boon Teik Chan ¹; Jean-François De Marneffe ¹; Martin Spieser ²; Armin Knoll ³; ...
Patterning sub-25nm half-pitch hexagonal arrays of contact holes with...
spie.org
Katholieke Univ. Leuven (Belgium) Boon Teik Chan, IMEC (Belgium) Doni Parnell, Tokyo Electron Europe Ltd. (Netherlands) Hengpeng Wu, EMD Performance Materials Corp. (United States) Jian Yin, EMD Performance Materials Corp. (United States) Yi Cao, EMD Performance Materials Corp. (United States) Roel Gronheid, IMEC (Belgium)
Reports & Statements
Patterning and Lithography Experts Convene at SPIE Symposiumblog.lamresearch.com › patterning-and-lithography-experts-convene-at-spi...
blog.lamresearch.com
20 Feb · ... Boon Teik Chan, Geert Mannaert, Geert Vandenberghe (imec); Grant Willson (U. of Texas at Austin); Christopher J. Ellison (U. of ...
Miscellaneous
US A1 - Etching of Block-Copolymers Google...
patents.google.com
Boon Teik CHAN, Shigeru Tahara: Original Assignee: Tokyo Electron Limited, Imec: Export Citation: BiBTeX, EndNote, RefMan: Patent Citations (3), Referenced by (1 ...
WO A1 - Procédé de texturage au plasma Google...
patents.google.com
A1, WO A1, WO-A , WO A1, WO A1, WO A1. Buluş Sahipleri, Boon Teik Chan.
Boon Teik Chan - сотрудник | ИСТИНА – Интеллектуальная Система...
istina.cemi-ras.ru
Boon Teik Chan ... Andy Goodyear, Braithwaite N.St, Yvonne Sutton, Mark Bowden, Efrain Altamirano-Sanchez, Alexey Zotovich, Otell Zaid El, Boon Teik Chan, ...
Boon Teik Chan | IMEC - Academia.edu
imec.academia.edu
Academia.edu is a place to share and follow research.
Via patterning in the 7-nm node using immersion ...
www.spiedigitallibrary.org
Jan Doise, Joost Bekaert, Boon Teik Chan, Masafumi Hori, and Roel Gronheid "Via patterning in the 7-nm node using immersion lithography and graphoepitaxy directed self-assembly," Journal of Micro/Nanolithography, MEMS, and MOEMS 16(2), (14 June 2017).
Conversion of a Patterned Organic Resist into a High ...
en.x-mol.com
X-MOL提供的期刊论文更新，ACS Nano——Conversion of a Patterned Organic Resist into a High Performance Inorganic Hard Mask for High Resolution Pattern Transfer，Jean-François de Marneffe, Boon Teik Chan, Martin Spieser, Guy Vereecke, Sergej …
Papers
www.avssymposium.org
Annelies Delabie (IMEC, Belgium); Diego Carbajal (UNAM); Job Soethoudt, Boon Teik Chan, Efrain Altamirano Sanchez, Ben Meynaerts, Jan-Willem Clerix, ...
DSA: How far have we come and how much further is left to go? Darron...
technodocbox.com
... AT THE 7 NM NODE Roel Gronheid 1, Jan Doise 1,2, Joost Bekaert 1, Boon Teik Chan 1, Ioannis Karageorgos 1,2, Julien Ryckaert 1, Geert Vandenberghe.
EIPBN Technical program v PDF
docplayer.net
... CDU AND Carolien Boeckx, Jan Doise, Boon Teik Chan, Stefan De Gendt and Paulina Rincon Delgadillo PATTERN PLACEMENT USING GRAPHO-EPITAXY ...
High selective plasma etching for PMMA of block-copolymer in...
www.semanticscholar.org
Semantic Scholar extracted view of
Insight into Selective Surface Reactions of Dimethylamino PubAgpubag.nal.usda.gov › catalog
pubag.nal.usda.gov
Author: Job Soethoudt, Yoann Tomczak, Ben Meynaerts, Boon Teik Chan, Annelies Delabie; Source: Journal of physical chemistry v.124 no.13 pp.
Evolution of roughness during the pattern transfer of high-chi, 10nm...
experts.umn.edu
Gregory Blachut, Stephen M. Sirard, Andrew Liang, Chris A. Mack, Michael J. Maher, Paulina A. Rincon-Delgadillo, Boon Teik Chan, Geert ...
Jan Doise | Research Portal
researchportal.be
Results of 23 · Authors: Jan Doise, Joost Bekaert, Boon Teik Chan, SungEun Hong, Guanyang Lin, Roel Gronheid, Christoph K Hohle, Todd R Younkin.
More results for JUAT - Namemeaningsdictionarynamemeaningsdictionary.com › juat › what-does-the-name-juat-mean
namemeaningsdictionary.com
Mohamed Ibrahim Tan Boon Teik Chan Sek Keong Chao Hick Tin Walter Woon Koh Juat Jong (acting) Sundaresh Menon Steven Chong V. K. Rajah Attorney-General ...
Otell Zaid El - сотрудник | ИСТИНА – Интеллектуальная Система...
istina.msu.ru
... Braithwaite N.St, Yvonne Sutton, Mark Bowden, Efrain Altamirano-Sanchez, Alexey Zotovich, Otell Zaid El, Boon Teik Chan, Knoll Armin W., Colin Rawlings, ...
What is the meaning of the name JUAT? - Thenamesdictionarythenamesdictionary.com › name-meanings › name-meaning-of-juat-means
thenamesdictionary.com
Mohamed Ibrahim Tan Boon Teik Chan Sek Keong Chao Hick Tin Walter Woon Koh Juat Jong (acting) Sundaresh Menon Steven Chong V. K. Rajah Attorney-General ...
Metal Oxide EUV Photoresists for N7 Relevant Patterns - PDF Free...
businessdocbox.com
Defect mitigation and root cause studies in IMEC's 4 nm halfpitch chemo-epitaxy DSA flow Hari Pathangi a*, Boon Teik Chan a, Hareen Bayana a, Nadia ...
Defect mitigation and root cause studies in 14 nm half-pitch...
www.spiedigitallibrary.org
SPIE Digital Library Journals
PTD / NTD NTD + DSA Shrinkeuvlsymposium.lbl.gov/pdf pres/T.%20Younkin.pdf
euvlsymposium.lbl.gov
Boon Teik Chan. Nadia Vandenbroeck. Vincent Truffert. Philippe Foubert. IMEC Material Support. AZ Electronic Materials. Brewer Science, Inc.
Defect mitigation and root cause studies in IMEC's 14nm half-pitch...
www.spiedigitallibrary.org
SPIE Digital Library Proceedings
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