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News
Moirans. Pollen Metrology lorgne vers les Etats-Unis pour se...
www.ledauphine.com
Johann Foucher rentre tout juste de San Francisco. Ce quadragénaire passionné a le sourire. Sa start-up, Pollen Metrology, installée sur la zone d’activités de...
CEA-Leti's Hybrid Metrology Project targets better R+D cycle times...
www.nanowerk.com
CEA-Letis Hybrid Metrology Project targets better R+D cycle times and yields at sub-28nm nodes
Nanotechnology Now - Press Release: CEA-Letis Hybrid Metrology...
www.nanotech-now.com
Project leader Johann Foucher, who presented the SPIE paper, said CD hybrid metrology potentially could be introduced in high-volume ...
:: SST Review ::
newsletters.pennnet.com
Johann Foucher, CEA-LETI; Ganesh Sundaram, Dmitry Gorelikov, Soluris Inc. Microlithography World, November :: Click for Full Story ::
Network Profiles
LinkedIn: Johann Foucher | Perfil profesional
Ver el perfil profesional de Johann Foucher en LinkedIn. LinkedIn es la red de negocios más grande del mundo que ayuda a profesionales como Johann Foucher a ...
LinkedIn: Johann FOUCHER - Donges, Pays de la Loire, France | Profil ...
Voir le profil professionnel de Johann FOUCHER sur LinkedIn. Grâce à LinkedIn, le plus grand réseau professionnel au monde, les professionnels tels que Johann FOUCHER peuvent découvrir des suggestions de candidat, des experts dans leur domaine et des partenaires commerciaux.
Interests
POLLEN Metrology Raises $2.4 Million to Support Smart ...
www.businesswire.com
· Contact: Johann FOUCHER, About XAnge XAnge is a Franco-German Venture Capital team with €400m under management, investing in …
Johann FOUCHER - Patents
www.freshpatents.com
Recent bibliographic sampling of Johann FOUCHER patents listed/published in the public domain by the USPTO (USPTO Patent Application #,Title):
POLLEN Metrology Raises $2.4 Million to Support Smart Factories...
ih.advfn.com
POLLEN Metrology Raises $2.4 Million to Support Smart Factories Globally
Business Profiles
Joubert, Olivier Pierre Etienne ( ; microélectronicien)
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L’application IdRef permet d’interroger les autorités des bases Calames, Sudoc, STAR, STEP et Thèses.fr, d'enrichir et/ou de corriger des notices autorités...
Education
Johann FOUCHER (DONGES) - Copains d'avant
copainsdavant.linternaute.com
FOUCHER Johann : Johann FOUCHER, né en et habite DONGES. Aux dernières nouvelles il était à Sides à SAINT NAZAIRE et il y est toujours. Il a étudié à...
Books & Literature
Allgemeines historisches Lexicon, in welchem das Leben und die Thaten...
books.google.de
Franciseum, der Ärohlicher gestorben j Abt von S. André. 3) Olivierij von Silly, Herr von Vautourne d Bures c.lebte Ä 483 und zeugte mit Johann Foucher
Applied Scanning Probe Methods VIII: Scanning Probe Microscopy...
books.google.de
The volumes VIII, IX and X examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in...
Nano Lithography - Google Books
books.google.de
... Supérieure d'Art et Communication (EAC) Pans France Johann FOUCHER CEA-LETI-Minatec Grenoble France Gianluca GRENCI CNR-lstituto Nazionale per ...
Scanning Probe Microscopy¿in Industrial Applications: Nanomechanical...
books.google.de
Describes new state-of-the-science tools and their contribution to industrial R&D With contributions from leading international experts in the field, this book...
Related Documents
CiteSeerX — Critical dimensionmetrology: perspectives and future...
citeseerx.ist.psu.edu
· @MISC{Foucher_criticaldimensionmetrology:, author = {Johann Foucher and Thomas Ernst and Erwine Pargon}, title = {Critical dimensionmetrology: perspectives ...
From CD to 3D sidewall roughness analysis with 3D CD-AFM, Proceedings...
www.deepdyve.com
Johann Foucher. a. a. CEA/LETI, 17 avenue des Martyrs, Grenoble, France. ABSTRACT. The continuous shrink of device's dimensions has reached such ...
Scientific Publications
Calibration Standards And Methods Of Fabrication Thereof(epo) Patents...
patents.justia.com
Date of Patent: May 27, Assignees: Commissariat a l'energie atomique et aux energies alternatives, Nanotools GmbH. Inventors: Johann Foucher, Bernd ...
AMIES : vecteur d’innovation mathématique-entreprises ...
amies-stories.sciencesconf.org
· Collaboration réussie maths-industrie : l'IA et la fusion de données au service des matériaux innovants - Johann Foucher (PhD)– Co-founder & CEO de Pollen Metrology 10: :30: Table ronde "Mathématiques et Santé " - Lise Bellanger - Maitre de conférence - Université de ...
Publications
Dr. Johann Foucher : SPIE.org Profile
spie.org
SPIE Profile : Dr. Johann Foucher - Regular Member - the International Society for Optics and Photonics.
Lithographie par division de pas de réseau pour les noeuds ...
theses.insa-lyon.fr
position des plaques pour l'étude sur le SIT ainsi que Johann Foucher pour les mesures AFM et Laurent Depré pour la calibration du modèle R3D. Je remercie ...
From CD to 3D sidewall roughness analysis with 3D CD-AFM | (2005) |...
spie.org
· Proceedings Paper From CD to 3D sidewall roughness analysis with 3D CD-AFM. Author(s): Johann Foucher. Format Member Price Non-Member Price ...
Reports & Statements
nanotools
www.nanotools.com
Paper: , presented by Johann Foucher/POLLEN Technology; Visit the conference page for details (external link) back. Contact: | +49 89
Miscellaneous
Johann Foucher | LinkedIn
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View Johann Foucher's professional profile on LinkedIn. LinkedIn is the world's largest business network, helping professionals like Johann Foucher discover inside
Johann Foucher | Entrepreneur & Co-Founder President/CEO at ...
www.linkedin.com
Check out professional insights posted by Johann Foucher, Entrepreneur & Co- Founder President/CEO at POLLEN Metrology.
FR B1 - Tool for determining atomic force microscope ...
patents.google.com
Johann Foucher Stephan Landis Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.) Commissariat a lEnergie Atomique et aux Energies Alternatives Original Assignee Commissariat a lEnergie Atomique et aux Energies Alternatives
US A1 - Method for producing a gate for a cmos transistor...
patents.google.com
Oorspronkelijke patenteigenaar, Olivier Joubert, Giles Cunge, Johann Foucher, David Fuard, Marceline Bonvalot, Laurent Vallier. Citatie exporteren, BiBTeX ...
US B2 - Method and structure for characterising an atomic force...
patents.google.com
A method for characterizing an atomic force microscopy tip using a characterization structure having two inclined sidewalls opposite one another and of...
Étude par microscopie à force atomique en trois dimensions de...
slideplayer.fr
... de la Microélectronique (LTM / CNRS) Directeur de thèse: Olivier JOUBERT ( CNRS) Encadrants : Johann FOUCHER (CEA-Leti) et Erwine PARGON (CNRS).
Johann Foucher - Ingré
www.trombi.com
Johann Foucher, Ingré (aujourd'hui), sorti en de Maurice Genevoix : adresse e-mail et photos
From CD to 3D sidewall roughness analysis with 3D CD-AFM
www.spiedigitallibrary.org
SPIE Digital Library Proceedings
Home - Pollen Metrology
pollen-metrology.com
The revolution of artificial intelligence for high performance materials. Accelerate the time to yield of new materials and processes.
2014年新书：Scanning Probe Microscopy in Industrial Applications - 微米纳米 -...
muchong.com
ScanningProbeMicroscopyinIndustrialApplications_NanomechanicalCharacterization_DaliaG.Yablon_2014ContentsContributorsListxiiiPrefacexvAcknowledgmentsxix1.Overvi...
Process-control in high tech factory isn’t what you think anymore. |...
medium.com
· Process-control in high tech factory isn’t what you think anymore Johann Foucher built a high profile team with experts in mathematics and machine learning in Grenoble. They show us strong ...
CEA-Leti claims measurement uncertainty reduction at sub-28nm -...
www.eetimes.com
EE Times connects the global electronics community through news, analysis, education, and peer-to-peer discussion around technology, business, products and...
ATOMIC FORCE MICROSCOPE TIP SHAPE DETERMINATION TOOL - Patent...
www.patentsencyclopedia.com
Inventors: Johann Foucher (Meylan, FR) Stèfan Landis (Voiron, FR) Stèfan Landis (Voiron, FR) Assignees: COMMISSARIAT A L'ENRGIE ...
Foucher, FR - Patent applications
www.patentsencyclopedia.com
Johann Foucher, Voreppe FR. Patent application number, Description, Published ... Johann Foucher, Meylan FR. Patent application number, Description ...
Laboratoire de Physique et Chimie des Nano-objets POLLEN...
lpcno.insa-toulouse.fr
Date : à 14:00. Titre : POLLEN METROLOGY. Intervenant : Johann Foucher. Provenance : Président - Fondateur de POLLEN METROLOGY.
Hyperbranched polymers for photolithographic applications towards...
hal.archives-ouvertes.fr
... Ralouca Tiron 3, Claire Sourd 3, Philippe Bandelier 3, 4, Johann Foucher 3, Hassan Ridaoui 5, Ali Dirani 5, Olivier Soppera 5, Damien Perret ...
Semiconductor Engineering - Week In Review: Manufacturing, Design,...
semiengineering.com
Who will buy IBM’s chip biz?; metrology startup; GF is hiring; Applied-TEL; new resist maker.
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