Matthew Wormington and X-Ray - Free people check

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APS APS March Meeting - Event - Off-Specular Neutron and X-ray...

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Session B25: Focus Session: Adhesion, Swelling, and Elastic ... Matthew Wormington (Bede X-ray Metrology) For applications in semiconductor processing ...

xraylib/AUTHORS at master · tschoonj/xraylib · GitHub

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A library for X-ray matter interaction cross sections for X-ray fluorescence applications - tschoonj/xraylib

Boris Yokhin - Patents

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Inventors: Isaac Mazor, Alex Tokar, Boris Yokhin, Matthew Wormington (Jordan Valley Semiconductors Ltd.) High-resolution x-ray ...

Differential Evolution: A Practical Approach to Global Optimization -...

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7.10 Application of Differential Evolution to the Analysis of X-Ray Reflectivity Data Matthew Wormington, Kevin M. Matney and D. Keith Bowen Abstract.

X-Ray Metrology in Semiconductor Manufacturing - D. Keith Bowen,...

books.google.de

These are: Matthew Wormington, in particular, for figures and discussions on porosity, x-ray reflectivity and diffuse scatter, genetic algorithms, and data fitting; ...

Official Gazette of the United States Patent and Trademark Office:...

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US 6,192,103 Bl FITTING OF X-RAY SCATTERING DATA USING EVOLUTIONARY ALGORITHMS Matthew Wormington. Englewood; Charles Panaccione.

Application of Differential Evolution to the Analysis of X-Ray...

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Matthew Wormington, Kevin M. Matney and D. Keith Bowen. Abstract. X-ray reflectivity (XRR) is a technique for characterizing the structure of thin, multi-layer ...

JISCMail - DAWN Archives

www.jiscmail.ac.uk

Matthew Wormington Chief Technologist, X-ray Business Unit. Bruker Semi Division 112 Robin Hill Road Santa Barbara, CA USA. Cell: +1(303)

US A1 - X-ray topographic system - Google ...www.google.com › patents

patents.google.com

Inventor: David Bowen: Matthew Wormington: Ladislav Pina: Petra Feichtinger; Current Assignee. The listed assignees may be inaccurate. Google has not ...

Characterisation of Interfaces in SiGe Superlatrlces by Combined...

www.cambridge.org

Characterisation of Interfaces in SiGe Superlatrlces by Combined Grazing Incidence X-Ray Fluorescence and Reflectivity - Volume 238

High-Resolution X-ray Diffraction of Epitaxial Thin-Films and ...docplayer.net › High-resolution-x-ray-diffraction-of-epita...

docplayer.net

High-Resolution X-ray Diffraction of Epitaxial Thin-Films and Patterned Nanostructures Matthew Wormington Acknowledgements Colleagues Paul Ryan & John ...

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Matthew Wormington and X-Ray Free People Check