Lubomir L. Jastrzebski - Patents
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Lubomir L. Jastrzebski patents ... Inventors: Alexandre Savtchouk, Jacek Lagowski, Lubomir L. Jastrzebski, Joseph Nicholas Kochey Archived*
QSS-μPCD measurement of lifetime in silicon wafers: advantages and...
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Authors. Marshall Wilson · Alexandre Savtchouk · Jacek Lagowski · Krisztian Kis- Szabo · Ferenc Korsos · Atilla Toth · Radovan Kopecek · Valentin Mihailetchi ...
Analytical and Diagnostic Techniques for Semiconductor Materials,...
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NEW COCOS (CORONA OXIDE CHARACTERIZATION OF SEMICONDUCTOR) METHOD FOR MONITORING THE RELIABILITY OF THIN GATE OXIDES Marshall Wilson, Jacek Lagowski and Alexandre Savtchouk Semiconductor Diagnostics, Inc.; Spectrum Blvd. Ste. 130; Tampa, FL Lubek Jastrzebski and ...
Gate Dielectric Integrity: Material, Process, and Tool Qualification...
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Marshall Wilson, m Jacek Lagowski, 1 Alexandre Savtchouk,l Lubek Jastrzebski,2 and John D'Amico2 COCOS (Corona Oxide Characterization of Semiconductor) Metrology: Physical Principles and Applications Reference: Wilson, M., Lagowski, J., Savtchouk, A., Jastrzebski, L., and D'Amico, J., "COCOS (Corona Oxide ...
EBSCOhost | | Accelerated Light-Induced Degradation (ALID)...
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MARSHALL WILSON,1 PIOTR EDELMAN,1,2 ALEXANDRE SAVTCHOUK,1. JOHN D'AMICO,1 ANDREW FINDLAY,1 and JACEK LAGOWSKI1.
EBSCOhost | | Band offset diagnostics of advanced...
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Band offset diagnostics of advanced dielectrics. Piotr Edelman Ж Marshall Wilson Ж John D'Amico Ж. Alexandre Savtchouk Ж Jacek Lagowski.
Recent Advancement in Charge and Photo-Assisted Non-Contact...
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Related Article. GaN & SiC Characterization II - Oct :45PM: Andrew David Findlay,; Marshall Wilson,; Alexandre Savtchouk,; John D'Amico,; Jacek Lagowski,; and Robert Hillard. Recent Advancement in Charge and Photo-Assisted Non-Contact Electrical Characterization of SiC, GaN, and AlGaN/GaN HEMT Meet.
All web results to the name "Alexandre Savtchouk"
US B2 - Accurate measuring of long steady state minority...
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Uitvinders, Jacek Lagowski, Alexandre Savtchouk, Marshall D. Wilson. Oorspronkelijke patenteigenaar, Semiconductor Diagnostics, Inc. Citatie exporteren ...
ACCURATE MEASURING OF LONG STEADY STATE MINORITY CARRIER DIFFUSION...
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Patent application title: ACCURATE MEASURING OF LONG STEADY STATE MINORITY CARRIER DIFFUSION LENGTHS Inventors: Jacek Lagowski (Tampa, FL, US) Alexandre Savtchouk
Digital SPV Diffusion Length Metrology (E8-Fe) for Ultra-High Purity...
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Lifetime Analysis and Characterization: Marshall Wilson, Alexandre Savtchouk, Igor Tasarov, John D'Amico, Piotr Edelman, Nick Kochey, and Jacek Lagowski
Kelvin Force Microscopy and corona charging for semiconductor...
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Kelvin Force Microscopy and corona charging for semiconductor material and device characterization. Dmitriy Marinskiy, Piotr Edelman, Jacek Lagowski, Thye Chong Loy, Carlos Almeida, Alexandre Savtchouk · Details · Contributors · Fields of science · Bibliography · Quotations · Similar · Collections ...
Non‐Contact C‐V Technique for high‐k Applications
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Piotr Edelman 1, Alexandre Savtchouk 1, Marshall Wilson 1, John D’Amico 1, Joseph N. Kochey 1, Dmitriy Marinskiy 1 and Jacek Lagowski 1 View Affiliations Hide
DRIP XIII. 13th International Conference on Defects Recognition,...
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... Piotr Edelman 1 ; Alexandre Savtchouk 1 ; John D Amico 1 ; Jacek Lagowski 1 ; 1 SemilabSDI In crystalline silicon, above bandgap illumination can transform ...
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Alexandre Savtchouk, John D'Amico, Igor Tasarov, Lubek Jastrzebski, and Jacek Lagowski; Manifestation of Cu Impurities on Silicon Surfaces, Implication for Monitoring
Jacek Lagowski
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Marshall Wilson, Alexandre Savtchouk, Jacek Lagowski, Krisztian Kis-Szabo, more · Energy Procedia > > 8 > Complete >
Review—Recent Advancement in Charge- and Photo-Assisted Non-Contact...
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GaN & SiC Characterization II - Oct :45PM: Andrew David Findlay,; Marshall Wilson,; Alexandre Savtchouk,; John D'Amico,; Jacek Lagowski,; and Robert Hillard. Recent Advancement in Charge and Photo-Assisted Non-Contact Electrical Characterization of SiC, GaN, and AlGaN/GaN HEMT Meet.
Novel noncontact approach to monitoring the field-effect passivation...
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Marshall Wilson, Alexandre Savtchouk, Jacek Lagowski, Ferenc Korsos, Atilla Toth, Radovan Kopecek, Valentin Mihailetchi, Roman ... Alexandre Savtchouk.
مقاله اندازه گیری QSS-μPCD از طول عمر در ویفرهای سیلیکونی: م
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مقاله اندازه گیری QSS-μPCD از طول عمر در ویفرهای سیلیکونی: مزایا و برنامه های جدید, در Energy Procedia () توسط Marshall Wilson, Alexandre Savtchouk, Jacek LagowskiFerenc Korsos, Atilla Toth, Radovan Kopecek, Valentin Mihailetchi.
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